Scott Stevens, Knoxville, USA, spoke about the durability of EVAR devices at the 35th CX Symposium (6-9 April 2013, London, UK). Stevens stated that going low profile should not compromise device performance.
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Scott Stevens, Knoxville, USA, spoke about the durability of EVAR devices at the 35th CX Symposium (6-9 April 2013, London, UK). Stevens stated that going low profile should not compromise device performance.